Studies of probe tip materials by atomic force microscopy: a review

• Ke Xu and
• Yuzhe Liu

Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104

• the direction of new probes and further promotes the broader and deeper application of scanning probe microscope (SPM). Keywords: AFM; carbon nanotube probe; colloid probe; metal probe; Introduction AFM represents a well-established technique for the investigation of the nanosurface morphology

• can also be used as a nanolight source or nanoscalpel to manipulate and operate on cells directly. Carbon nanotube probe Carbon nanotubes (CNTs) are considered an ideal AFM tip material due to their small diameter, high aspect ratio, mechanical robustness, large Young's modulus, and well-defined

• structure [37][38]. Due to these unique properties, CNT-AFM probes offer a longer lifetime, high spatial resolution, and unprecedented sensitivity than their conventional silicon counterparts. Carbon nanotubes are generally prepared by assembled and grown methods. Assembled carbon nanotube probe Nishijima

Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

• Sergei Magonov and
• John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

• diameter. The same width was 4–5 nm on imaging with a carbon nanotube probe due to its high aspect ratio. In compositional mapping, the visualization of individual components is more important than obtaining the correct values of local mechanical or electrical properties. Therefore, the spatial resolution